Reference:Reference-033976

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Author(s)Umalwara, Mohammed; Shaik, Mohammed Ali;
BibTypeconferencePaper
TitleEnvironmental Impact Analysis on Crop Yield using Feature-Aware Deep Learning and Remote Sensing
Year2025-12-05
Pages1–6
URLhttps://ieeexplore.ieee.org/document/11326781/
DOI10.1109/AESPC67542.2025.11326781
NoteAuto downloaded ref at: 2026-06-11


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2026-08-31

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