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BibEntryCargo > Volume : 6 or 93-4181 & Note: Auto downloaded ref at: 2020-07-15

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Beckers, Brian; Schütt, Brigitta; (1) · Bove, Gerald; Becker, Austin; Sweeney, Benjamin; Vousdoukas, Michalis; Kulp, Scott; (1) · Cammalleri, C.; Micale, F.; Vogt, J.; (1) · Dankers, R.; Feyen, L.; Christensen, O. B.; (1) · Dankers, Rutger; Christensen, Ole Bøssing; Feyen, Luc; Kalas, Milan; de Roo, Ad; (1) · Dankers, Rutger; Feyen, Luc; (2) · Dimitriadis, Panayiotis; Tegos, Aristoteles; Oikonomou, Athanasios; Pagana, Vassiliki; Koukouvinos, Antonios; Mamassis, Nikos; Koutsoyiannis, Demetris; Efstratiadis, Andreas; (1) · Fernández, Alfonso; Najafi, Mohammad Reza; Durand, Michael; Mark, Bryan G.; Moritz, Mark; Jung, Hahn Chul; Neal, Jeffrey; Shastry, Apoorva; Laborde, Sarah; Phang, Sui Chian; Hamilton, Ian M.; Xiao, Ningchuan; (1) · Fernández-Blanco, R.; Kavvadias, K.; Hidalgo González, I.; (1) · Feyen, Luc; Vrugt, Jasper A.; Nualláin, Breanndán Ó; van der Knijff, Johan; De Roo, Ad; (1) · Gai, Lingtong; Nunes, João P.; Baartman, Jantiene E.M.; Zhang, Hongming; Wang, Fei; de Roo, Ad; Ritsema, Coen J.; Geissen, Violette; (1) · Hancock, G.R.; J.B.C., Lowry; Coulthard, T.J.; (1) · Hancock, G.R.; Saynor, M.; Lowry, J.B.C.; Erskine, W.D.; (1) · Hancock, G.R.; Verdon-Kidd, D.; Lowry, J.B.C.; (2) · Hirpa, Feyera A.; Salamon, Peter; Beck, Hylke E.; Lorini, Valerio; Alfieri, Lorenzo; Zsoter, Ervin; Dadson, Simon J.; (1) · Liu, Zhu; Merwade, Venkatesh; (2) · Lowry, J.B.C.; Narayan, M.; Hancock, G.R.; Evans, K.G.; (1) · Martínez-Fernández, J.; Almendra-Martín, L.; de Luis, M.; González-Zamora, A.; Herrero-Jiménez, C.; (1) · Mehrnegar, Nooshin; Jones, Owen; Singer, Michael Bliss; Schumacher, Maike; Bates, Paul; Forootan, Ehsan; (1) · Revilla-Romero, Beatriz; Beck, Hylke E.; Burek, Peter; Salamon, Peter; de Roo, Ad; Thielen, Jutta; (1) · Revilla-Romero, Beatriz; Wanders, Niko; Burek, Peter; Salamon, Peter; de Roo, Ad; (1) · Rojas, R.; Feyen, L.; Bianchi, A.; Dosio, A.; (1) · Salamon, Peter; Feyen, Luc; (1) · Seenath, Avidesh; Wilson, Matthew; Miller, Keith; (1) · Siev, Sokly; Ann, Vannak; Nakamura, Takashi; Fujii, Hideto; Yoshimura, Chihiro; Soleh Setiyawan, A.; Dwi Ariesyady, H.; Nastiti, A.; Roosmini, D.; Sonny Abfertiawan, M.; (1) · Skinner, Christopher J.; Coulthard, Thomas J.; Parsons, Daniel R.; Ramirez, Jorge A.; Mullen, Liam; Manson, Susan; (1) · Sutanto, Samuel Jonson; Vitolo, Claudia; Di Napoli, Claudia; D’Andrea, Mirko; Van Lanen, Henny A.J.; (1) · Thirel, G.; Notarnicola, C.; Kalas, M.; Zebisch, M.; Schellenberger, T.; Tetzlaff, A.; Duguay, M.; Mölg, N.; Burek, P.; de Roo, A.; (1) · Van Hateren, Theresa C.; Sutanto, Samuel J.; Van Lanen, Henny A.J.; (1) · Villanueva, I.; Wright, N. G.; (1) · Walsh, Peter; Jakeman, Anthony; Thompson, Chris; (1) · Willis, Thomas; Wright, Nigel; Sleigh, Andrew; (1) · Wu, Xushu; Wang, Zhaoli; Guo, Shenglian; Liao, Weilin; Zeng, Zhaoyang; Chen, Xiaohong; (1) · Xie, Jun; Wang, Ming; Liu, Kai; Coulthard, Tom J.; (1) · Yoon, Yeosang; Durand, Michael; Merry, Carolyn J.; Clark, Elizabeth A.; Andreadis, Konstantinos M.; Alsdorf, Douglas E.; (1) · Yoon, Yeosang; Durand, Michael; Merry, Carolyn J.; Rodriguez, Ernesto; (1) · Yu, Wansik; Kim, Yeonsu; Lee, Daeeop; Lee, Giha; (1) · Zajac, Zuzanna; Revilla-Romero, Beatriz; Salamon, Peter; Burek, Peter; Hirpa, Feyera A.; Beck, Hylke; (1)
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428–442 (2)
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